Speakers
Invited Speaker
This talk will highlight recent advances in direct imaging of polymer structure via 4D-STEM (nanobeam diffraction imaging). Through the development of fast direct electron detectors, it is now possible to acquire large multidimensional diffraction data sets that can map local structural order and strain with nanometer precision, even during in situ nanomechanical testing. The method is widely applicable and examples will be given from systems such as organic semiconductor molecular thin films, nanoparticles and even nominally amorphous samples. This talk will describe our recent results that demonstrate the first simultaneous cryogenic 4D-STEM mapping of amorphous and crystalline structure at an interface in a semicrystalline polymer blend using a single low-dose data acquisition. Lastly, recent developments in fast direct electron detector technology and algorithm development promise to increase the throughput, ease of use and widespread applicability of 4D-STEM.
Talk Title: 4D-STEM of soft materials
University of California, Berkeley
Bio: Andrew Minor is a Professor at the University of California, Berkeley in the Department of Materials Science and Engineering and also holds a joint appointment at the Lawrence Berkeley National Laboratory where he is the Facility Director of the National Center for Electron Microscopy in the Molecular Foundry. He received a B.A. in Economics and Mechanical Engineering from Yale University and his MS and Ph.D. in Materials Science and Engineering from U.C. Berkeley. He has co-authored over 235 publications and presented over 135 invited talks on topics such as nanomechanics, lightweight alloy development, characterization of soft materials and in situ TEM technique development. His honors include the LBL Materials Science Division Outstanding Performance Award (2006 & 2010), the AIME Robert Lansing Hardy Award from TMS (2012) and the Burton Medal from the Microscopy Society of America (2015).