Edge illumination (EI) is an X-ray imaging technique that, in addition to conventional absorption contrast, provides refraction and scatter contrast. It relies on an absorption mask in front of the sample that splits the X-ray beam into beamlets, which hits a second absorption mask positioned in front of the detector. The sample mask is then shifted in multiple steps with respect to the detector mask, thereby measuring an illumination curve per detector element. From the width, position, and area of this curve the absorption, refraction, and scatter contrast is then estimated.
In this talk, the conventional EI X-ray imaging protocol is revisited and recent efforts to increase flexibility in both acquisition and multi-contrast image reconstruction are discussed.

Flexible Edge illumination based imaging

Speakers

Jan Sijbers