Webinar: Discover the Future of 3D X-ray Microscopy with EclipseXRM
Sigray Inc. is excited to unveil their latest innovation, EclipseXRM™. Director of X-ray Microscopy, Jeff Gelb, presents a groundbreaking 3D x-ray microscope (XRM) that provides the highest resolution performance on the market.
Highlights of the Webinar:
- Unprecedented Spatial Resolution: EclipseXRM™ delivers an extraordinary 0.3 μm (300 nm) spatial resolution, including high resolution at large woresolution and the highest 3D image clarity, making it a game-changer for various applications.
- Breakthrough Patent-pending High Efficiency Architecture using multiple x-ray sources and x-ray detectors.
- In Situ Imaging Capabilities: Achieve submicron resolution at large working distances, enabling high-quality imaging under diverse environmental conditions.
- Enhanced X-ray Microscope Capabilities: Learn about our AI-based software, advanced scan modes, superior phase contrast performance, and multi-spectral source for near-monochromatic imaging.
Applications and Impact:
Examples will be presented on how EclipseXRM™ has revolutionised fields in failure analysis, 3D printing, geology, battery cathode and anode device characterisation, and biological research. Its unparalleled flexibility and commercially-leading resolution performance make it the ultimate tool for researchers in busy Central Laboratories.
Speaker:
JEFF GELB
Director of X-ray Microscopy·Sigray, Inc.
