Electron Microscopy Spring School 2025

Louie Aspinall

University of Leeds

Louie carried out his PhD in TEM characterisation of DNA binding proteins at the University of Glasgow, where he found his love for TEM. He is currently working as a Technician in Electron Microscopy at the University of Leeds. He frequents in both negative stain TEM and cryoEM, and has a particular interest in methods development.

Nicole Hondow

University of Leeds

Nicole is an Associate Professor in the area of Materials Characterisation at the University of Leeds. Prior to this she completed undergraduate and postgraduate studies in Chemistry at The University of Western Australia, and undertook postdoctoral research University of Leeds in the electron microscopy of materials relevant to catalysis and toxicology. Nicole’s current research uses analytical electron microscopy in the examination and quantification of nanomaterials in complex matrices. She is particularly interested in applying cryogenic approaches to capture nano- and soft-materials in the native state, with analysis by analytical (S)TEM and FIB-SEM.

Rik Brydson

RMS Honorary Secretary Physical Science, University of Leeds

Rik holds a chair in the Institute for Materials Research (IMR) in the School of Process Environmental and Materials Engineering at the University of Leeds. He heads the NanoCharacterisation group based around the Leeds Electron Microscopy and Spectroscopy (LEMAS) centre which is shared between Materials and Earth Sciences and also acts as an EPSRC facility for external UK researchers. He has a general research interest in high spatial resolution chemical analysis in nanostructured materials, and has a current research h index of 32 with over 25 years research experience in nanomaterials characterisation. He has managed extensive national and international collaborations including being current consortium leader for the UK National Facility for Aberration corrected Electron Microscopy, SuperSTEM at Daresbury. 

Rik is also on the Management Board of the European Microscopy Society. He has written an RMS Handbook on Electron Energy Loss Spectroscopy (Bios /Taylor and Francis 2001), has co-written a book on “Nanoscale Science and Technology" (Wiley 2005), edited a recent RMS book on Analytical Aberration-corrected Transmission Electron Microscopy with Wiley and has contributed a number of other chapters in specialist books on electron microscopy by other professional bodies covering Physics, Chemistry and Engineering. In recent years his research interests have focused on applying high spatial resolution characterisation methods (particularly TEM and EELS) to the nanochemical analysis of softer, more radiation sensitive materials.