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- Frontiers in Physical Imaging 2024
- Programme
Please note the programme is provisional and subject to change.
Tuesday 19 November
09:30 – 10:30
Radiation damage reduction by a non-conventional scan strategy in STEM
Invited Speaker
10:30 – 11:00
Rajat Nama - High-Resolution Characterization of In-Reactor Corrosion of Novel Zr-Nb Alloys
Talk
11:30 – 12:00
Christopher G. H, Walker - Acquisition of electron energy spectra and images using a miniature electron energy analyser
Talk
12:00 – 12:30
Rik Brydson - Studying the crystallization of inorganic materials using correlated transmission electron microscopy
Talk
12:30 – 13:00
Luisa María Valencia Liñán - Chemical evolution of polymer materials for additive manufacturing during STEM-EELS electron beam irradiation
Talk
14:00 – 15:00
Techniques for 3D imaging and image analysis in biomineralization. State of affairs, trends and aspirations.
Invited Speaker
15:00 – 15:30
Julia Parker - Exploiting nanoprobe X-ray techniques for in situ imaging of crystallisation
Talk
15:30 – 16:00
Fabio Nudelman - Dynamic change of calcium-rich compartments during coccolithophore biomineralization
Talk
16:00 – 16:30
Jessica Walker - Advances in in situ research at Diamond’s Hard X-ray Nanoprobe
Talk
16:30 – 16:35
Daniel Phifer - Thermo Fisher Scientific: Visualizing chemistry with the MicroReactor in a DualBeam™
Techno Bite
16:40 – 16:45
Felix Schaebbicke - Merrow Scientific Ltd: Innovation in X-ray microscopy and in-situ analysis in SEM and TEM
Techno Bite
16:45 – 16:50
Calum Dickinson - JEOL: Observation of Experiments 20 times faster than a Blink of an Eye
Techno Bite
Wednesday 20 November
10:00 – 11:00
Imaging-based measurements and artificial intelligence for advanced characterisation of musculoskeletal tissues and biomaterials
Invited Speaker
11:30 – 12:00
Ihsan Çaha - Electron Microscopy Analysis of Layered Li(Ni₁₋ₓ₋ᵧMnₓCoᵧ)O₂ (NMC) Cathode Materials for Li-Ion Batteries
Talk
12:00 – 12:30
Jack Donoghue - Automated in-situ mechanical testing within the SEM for greater spatial and temporal resolution
Talk
13:30 – 14:30
The Advantages of Sparse Sampling and Inpainting for High Resolution, In-situ and Ultrafast Electron Microscopy
Invited Speaker
14:30 – 15:00
Artur Blackburn - Projector Lens Distortion Correction Methods to Realize Sub-Ångström, 20 keV ptychography in a Scanning Electron Microscope
Talk
15:00 – 15:30
Manfred Schuster - Combining in-situ synchrotron and electron microscopy techniques to study NiFe catalysts for CO2 methanation
Talk
15:30 – 16:00
Ping-Luen Baron Ho - Spatial Differentiation of Aluminium Siting by the Single Atom Sites within Zeolite by Electron Ptychography
Talk