Of the general meeting series: presentations and discussions of recent advances and improvements in electron and X-ray microscopy, as applied in the physical sciences to study materials, nanoparticles, thin films, interfaces, device structures and artefacts of this meeting: focus on in-situ microscopy techniques.
Scientific Organisers:
Asa Barber
Asa is Professor of Advanced Materials Engineering at London South Bank University and Dean of the School of Engineering. His interests are in using microscopy to understand the relationship between microstructure and mechanical properties of complex systems, particularly hierarchical structures produced by biology. Asa previously led major initiatives in small scale mechanical testing combining EM with AFM at Queen Mary University of London and 3D imaging within a broader 3D engineering activity at the University of Portsmouth. Asa regularly supports the RMS Microscience Microscopy Congress in various capacities and was the Conference Chair for Tomography for Scientific Advancement (ToScA) ’17.
Roland Kröger
Roland is a Professor at the Department of Physics at the University of York concentrating on Nano- and Biomaterials using electron microscopy as well as various spectroscopy tools including Raman microscopy and X-ray techniques. He obtained his PhD from the University of Hamburg/Germany and the Fraunhofer Institute for Surface Science and Technology in Braunschweig/Germany. Roland has since built a large expertise in Materials Physics and Materials Science covering diamond thin films, metal/semiconductor nanostructures, nitride based light-emitting devices, metal nanoparticles for biomedical applications and biominerals using focused ion beam as a key method for sample preparation and analysis. Besides his interest in multi-lengthscale material characterization in 3D he is particularly focussing on in situ techniques to study mineralisation processes in liquid environments.
Thomas Walther
Thomas is Reader in Advanced Electron Microscopy at the University of Sheffield and Director of the Kroto Centre for High Resolution Imaging and Analysis.
His research areas include electron microscopy method development and instrumentation, in particular HREM, EFTEM, ADF-STEM, EELS, ELNES, EDX.
A focus is on quantitative analysis of semiconductor quantum wells and quantum dots, but also the study of interdiffusion and segregation at grain boundaries and within metal nano-particles.
He runs the Microscopy of Semiconducting Materials conference series which is alternatingly held in Oxford and Cambridge, always in odd years.
RMS Organisers:
Nick Cameron
nick@rms.org.uk
01865 254772
Contact Nick for exhibition and sponsorship event queries and RMS Corporate Membership.