15 January 2025
0900 - 1300 GMT: In-person Training Session
1300 - 1700 GMT: FIB & Prep Workshop
In-person & Online
The UK FIB&Prep User Group aims to provide an open platform for users of FIB (Focused Ion Beam) techniques and EM (Electron Microscope) specimen preparation equipment to share knowledge and explore best practices. Participants can exchange both theoretical and experimental insights, receive tips on preparing challenging specimens, and explore 2D and 3D analysis of complex data sets. It also offers an opportunity to learn about the latest instrumentation developments while connecting with both new and familiar colleagues.
Since its inception in 2013, its annual meeting has grown in stature, attracting a large number of participants. In response to attendee feedback, this year’s event will include hands-on training sessions focused on FIB applications such as Cross-sectioning, TEM sample prep and 3D EDS/EBSD. The workshop will be held hybrid (in Manchester and online).
With the rapid progression of FIB systems and sample preparation technologies, as well as their growing availability worldwide, we expect that expert-led presentations on the latest technological developments and their broad applications will offer valuable new insights.
Scientific Organiser
Dr Xiangli Zhong FRMS, MIMMM
Xiangli is a Senior Experimental Officer in the School of Materials, University of Manchester. Xiangli obtained her BEng in Metrology Instrumentation and MEng in Materials Science and Engineering. She has registered her PhD since 2006 in National University of Singapore. Xiangli has extensive experience and rich knowledge on electron microscopies, ion microscopies and sample preparation techniques. Her current research interest is on minimising focused ion beam (FIB) induced damages and FIB technical development on various types of materials.
RMS Organisers
Victoria Masters
victoria@rms.org.uk
01865 254769
Contact Victoria for RMS Event Hosting, Corporate Member Hosted events and RMS EDI&A queries.
