infocus #33 March 2014 Examples of Focused Ion Beam (FIB) Milling for Analysing Samples

FIB systems have been produced commercially for approximately 30 years primarily for the semiconductor industry. Recently, earth science researchers have used FIB for studying various geological materials in this article the author explores examples of FIB milling for analysing samples.

DOI: 10.22443/rms.inf.1.106

FIB systems have been produced commercially for approximately thirty years primarily for the semiconductor industry. Recently, earth science researchers have used FIB for studying various geological materials

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Author

AbdusSattar A.K. AzZubaydi

AbdusSattar A.K. AzZubaydi MSc in Reactor Physics and Technology, University of Birmingham (UoB) 1973 PhD in Physical Metallurgy and Science of Materials, University of Birmingham 1976 A.K. AzZubaydi was Researcher in Materials and a group-leader in the field of Electromagnetic Isotope Separation (EMIS) in the Iraqi Atomic Energy Commission (IAEC) and Industrial Military Enterprise (IME). In 2003 he was reappointed as assistant professor in the College of Engineering-University of Baghdad (UoBagd) teaching mathematics and physics. In 2008 he left the university on sabbatical leave to join the EM group at the University of Birmingham after he got a grant from CARA and technical support from the School of Metallurgy and Materials UoB. In the summer of 2010 A.Z AzZubaydi joined the CEM group for another three months training (UNESCO-Qatari grant). During these two periods his work concentrated on the investigation of hydrides in zircaloys using electron microscopy. He is currently involved with FIB microscopy and its applications in nanotechnology.