infocus #26 June 2012 Optimising Surface Characterisation of Gunshot Residue

DOI: 10.22443/rms.inf.1.84

Scanning electron microscopy (SEM) combined with energy-dispersive X-ray spectroscopy (EDS) is the most common method for the forensic analysis of gunshot residue (GSR); however, these techniques are unable to analyse the surface chemistry of GSR. This article discusses the use of X-ray photoelectron spectroscopy
(XPS) in conjunction with SEM/EDS for precise and reliable characterisation of the fine fraction of GSR particles. Experimental results demonstrate that this approach allows for important information to be revealed regarding the surface composition and surface chemistry of GSR.