
Expertise
Imaging Platforms
Keywords - Light Microscopy: Atomic Force Microscopy, Widefield microscopy
Keywords - Electron Microscopy: Transmission EM, Scanning EM (FEG), Focused Ion Beam SEM, Scanning Transmission EM, Scanning EM (Tungsten)
X-ray diffraction (XRD)
Keywords - X-Ray Microscopy: MicroCT
Applications
Keywords - Physical Sciences: Metallurgy/Alloy development, Functional oxides, Nanomaterials, Composites, Polymers & organic electronics
Sample Preparations
Keywords - Biological: Resin embedding, Metal coating
Keywords - Materials: Argon ion thinning, Focused ion beam (Gallium)
Data Analysis
Keywords - Software: ImageJ